Thermal accumulation effect in three-dimensional recording by picosecond pulses
نویسندگان
چکیده
In-bulk recording without cracking in borosilicate glass by high repetition rate (80 MHz) 12 ps pulses at 355 nm wavelength is demonstrated and discussed. The theoretical model of a “hot-line” scan and thermal accumulation qualitatively well describes the experimental results. The analytical expression of a thermally induced stress was obtained. © 2004 American Institute of Physics. [DOI: 10.1063/1.1829799]
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